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Publication

Deep Learning for Sparse Scanning Electron Microscopy

Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek
In: Microscopy and Microanalysis 25. Microscopy & Microanalysis (M&M-2019), August 4-8, Portland, Oregon, USA, Cambridge University Press, 2019.

Abstract

We investigated into a new approach that uses deep learning for the reconstruction of sparsely sampled SEM images.