Fault Ordering for Automatic Test Pattern Generation of Reversible Circuits

@inproceedings{pub6683,
    author = {

Wille, Robert
 and 

Zhang, Hongyan
 and 

Drechsler, Rolf
},
    title = {Fault Ordering for Automatic Test Pattern Generation of Reversible Circuits},
    booktitle = {Proceedings of the 43rd International Symposium on Multiple-Valued Logic. IEEE International Symposium on Multiple-Valued Logic (ISMVL-2013), 43rd, May 22-24, Toyama, Japan},
    year = {2013},
    publisher = {IEEE}
}