Agents and Simulated Reality

Page 3 of 4.

1. Patrick Trampert; Jan Vogelgesang; C. Schorr; M. Maisl; Sviatoslav Bogachev; Nico Marniok; A. Louis; Tim Dahmen; Philipp Slusallek

   Spherically symmetric volume elements as basis functions for image reconstructions in computed laminography

   In: Journal of X-Ray Science and Technology, Vol. 25, No. 4, IOS Press, 2017.

2. A. Kruglova; M. Roland; S. Diebels; Tim Dahmen; Philipp Slusallek; F. Mücklich

   Modelling and characterization of ductile fracture surface in Al-Si alloys by means of Voronoi tessellation

   In: Materials Characterization, Vol. 131, Elsevier, 2017.

3. Tim Dahmen; Michael Engstler; Christoph Pauly; Patrick Trampert; Nils de Jonge; Frank Mücklich; Philipp Slusallek

   Feature Adaptive Sampling for Scanning Electron Microscopy

   In: 12th European Congress for Stereology and Image Analysis 2017. European Congress for Stereology and Image Analysis (ECSIA-17), 12th, September …

4. Tim Dahmen; Patrick Trampert; Niels de Jonge; Philipp Slusallek

   Advanced recording schemes for electron tomography

   In: MRS Bulletin, Vol. 41, No. 07, Pages 537-541, Cambridge University Press, 7/2016.

5. Patrick Trampert; Delei Chen; Sviatoslav Bogachev; Tim Dahmen; Philipp Slusallek

   Dictionary-based Filling of the Missing Wedge in Electron Tomography

   In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Pages …

6. Tim Dahmen; Michael Engstler; Christoph Pauly; Patrick Trampert; Niels de Jonge; Frank Mücklich; Philipp Slusallek

   Feature Adaptive Sampling for Scanning Electron Microscopy

   In: Scientific Reports (Sci Rep), Vol. 6, Page 25350, Nature Publishing Group, 5/2016.

7. Tim Dahmen; Holger Kohr; Andrew Lupini; Jean-Pierre Beaudoin; Christian Kübel; Patrick Trampert; Philipp Slusallek; Niels de Jonge

   Combined Tilt- and Focal-Series Tomography for HAADF-STEM

   In: Microscopy Today, Vol. 24, Pages 26-30, Microscopy Today, 5/2016.

8. Tim Dahmen; Philipp Slusallek; Patrick Trampert; Frank Mücklich; Michael Engstler; Christoph Pauly; Niels de Jonge

   Smart Microscopy: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

   In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Page 632, …

9. Patrick Trampert; Sviatoslav Bogachev; Nico Marniok; Tim Dahmen; Philipp Slusallek

   A Comparative Study of Three Marker Detection Algorithms in Electron Tomography

   In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Pages …

10. Patrick Trampert; Sviatoslav Bogachev; Nico Marniok; Tim Dahmen; Philipp Slusallek

    Marker Detection in Electron Tomography: A Comparative Study

    In: Microscopy and Microanalysis, Vol. 21 (Issue 6), Pages 1591-1601, Cambridge Journals, 11/2015.

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