Embedded Intelligence

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1. Tim Dahmen; Patrick Trampert; Philipp Slusallek

   Blob-based Algebraic Reconstruction Technique for Computed Laminography

   In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 994-995, Cambridge University Press, 8/2018.

2. Patrick Trampert; Tim Dahmen; Philipp Slusallek

   Fact or Fiction: Maximal Image Quality with Minimal Dwell Time

   In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 480-481, Cambridge University Press, 8/2018.

3. Patrick Trampert; Faysal Bourghorbel; Pavel Potocek; Maurice Peemen; Christian Schlinkmann; Tim Dahmen; Philipp Slusallek

   How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?

   In: Ultramicroscopy, Vol. 191, Pages 11-17, Elsevier, 8/2018.

4. Patrick Trampert; Wu Wang; Delei Chen; Raimond BG Ravelli; Tim Dahmen; Peter J Peters; Christian Kübel; Philipp Slusallek

   Exemplar-based inpainting as a solution to the missing wedge problem in electron tomography

   In: Ultramicroscopy, Vol. 191, Pages 1-10, Elsevier, 8/2018.

5. Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek

   Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy

   In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 700-701, Cambridge University Press, 8/2018.

6. Kelly Parker; Patrick Trampert; Verena Tinnemann; Diana Peckys; Tim Dahmen; Niels de Jonge

   Linear Chains of HER2 Receptors Found in the Plasma Membrane Using Liquid-Phase Electron Microscopy

   In: Biophysical Journal, Vol. 115, Pages 503-513, Elsevier, 6/2018.

7. Faysal Boughorbel; Pavel Potocek; Milos Hovorka; Libor Strakos; John Mitchels; Tomas Vystavel; Patrick Trampert; Ben Lich; Tim Dahmen

   High-Throughput Large Volume SEM Workflow using Sparse Scanning and In-painting Algorithms Inspired by Compressive Sensing

   In: Microscopy and Microanalysis, Vol. 23, No. S1, Pages 150-151, Cambridge University Press, 7/2017.

8. Tim Dahmen; Michael Engstler; Christoph Pauly; Patrick Trampert; Nils de Jonge; Frank Mücklich; Philipp Slusallek

   Feature Adaptive Sampling for Scanning Electron Microscopy

   In: 12th European Congress for Stereology and Image Analysis 2017. European Congress for Stereology and Image Analysis (ECSIA-17), 12th, September …

9. Patrick Trampert; Jan Vogelgesang; C. Schorr; M. Maisl; Sviatoslav Bogachev; Nico Marniok; A. Louis; Tim Dahmen; Philipp Slusallek

   Spherically symmetric volume elements as basis functions for image reconstructions in computed laminography

   In: Journal of X-Ray Science and Technology, Vol. 25, No. 4, IOS Press, 2017.

10. Tim Dahmen; Patrick Trampert; Niels de Jonge; Philipp Slusallek

    Advanced recording schemes for electron tomography

    In: MRS Bulletin, Vol. 41, No. 07, Pages 537-541, Cambridge University Press, 7/2016.

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