Embedded Intelligence

Page 58 of 58.

1. Stephan Eggersglüß; Rolf Drechsler

   As-Robust-As-Possible Test Generation in the Presence of Small Delay Defects using Pseudo-Boolean Optimization

   In: Proceedings of DATE 11 - Design, Automation & Test in Europe. The European Event for Electronic System Design & Test. Design, Automation & Test in …

2. Stephan Eggersglüß; Rolf Drechsler

   Efficient Data Structures and Methodologies for SAT-based ATPG providing High Fault Coverage in Industrial Application

   In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), Vol. 30, No. 9, Pages 1411-1415, IEEE Press, 2011.

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