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Publication

Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy

Patrick Trampert; Sabine Schlabach; Tim Dahmen; Philipp Slusallek
In: Microscopy and Microanalysis, Vol. 24, No. S1, Pages 700-701, Cambridge University Press, 8/2018.

Abstract

High-throughput scanning electron microscopy (SEM) aims to reduce dose for sensitive specimens as well as reducing acquisition times to be able to acquire large volumes in a meaningful time. Sparse sampling is one key to make such acquisitions possible. We propose a new reconstruction technique for such sparsely sampled SEM data, which is based on exemplar-based inpainting known from image processing.