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Publications

Displaying results 61 to 70 of 503.
  1. Marie-Helene Stoltz; Vaggelis Giannikas; Duncan Mcfarlane; James Strachan; Jumyung Um; Rengarajan Srinivasan

    Augmented Reality in Warehouse Operations: Oppaortunities and Barriers

    In: IFAC-PapersOnLine, Vol. 50, No. 1, Pages 12979-12984, Elsevier, 2017.

  2. Training CNNs for Image Registration from Few Samples with Model-based Data Augmentation

    In: Maxime Descoteaux; Lena Maier-Hein; Alfred Franz; Pierre Jannin; D. Louis Collins; Simon Duchesne (Hrsg.). Medical Image Computing and Computer …

  3. Hans-Wolfgang Micklitz; Lucia Reisch; Gesche Joost; Helga Zander-Hayat (Hrsg.)

    Verbraucherrecht 2.0 - Verbraucher in der digitalen Welt

    ISBN 9783848741878, Nomos, 2017.

  4. Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill

    Neural Computation of Statistical Image Properties in Peripheral Vision

    In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …

  5. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  6. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …

  7. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …

  8. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …

  9. Saeideh Shirinzadeh; Mathias Soeken; Pierre-Emmanuel Gaillardon; Giovanni De Micheli; Rolf Drechsler

    Endurance Management for ResistiveLogic-In-Memory Computing Architectures

    In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017), March 27-31, Lausanne, Switzerland, 2017.