Robotics Innovation Center

Publications

Page 3 of 4.

Sebastian Huhn; Rolf Drechsler
Next Generation Design For Testability, Debug and Reliability Using Formal Techniques
In: Proceedings of the International Test Conference (ITC). International Test Conference (ITC-2022), September 25-30, Anaheim, USA, 2022.
Marcel Merten; Mohammed E. Djeridane; Sebastian Huhn; Rolf Drechsler
SAT-based Key Determination Attack for Improving the Quality Assessment of Logic Locking Mechanisms
In: 15th International Workshop on Boolean Problems. International Workshop on Boolean Problems (IWSBP-2022), September 22-23, 2022.
Payam Habiby; Sebastian Huhn; Rolf Drechsler
Test Scheduling Optimization Model for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability
In: 33. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2021). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von …
Buse Ustaoglu; Sebastian Huhn; Rolf Drechsler
A Memory-Upscaled Boolean Satisfiability Solver for Complex On-Chip Self-Verification Tasks
In: Workshop on Interdependent Challenges of Reliability, Security and Quality (RESCUE). Workshop on Interdependent Challenges of Reliability, …
Sebastian Huhn; Rolf Drechsler
Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques
ISBN 978-3-030-69208-7, Springer, 2021.
Payam Habiby; Sebastian Huhn; Rolf Drechsler
Optimization-based Test Scheduling for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability
In: 16th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). International Conference on Design & …
Marcel Merten; Sebastian Huhn; Rolf Drechsler
A Codeword-based Compactor for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks
In: Proceedings of the 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International …
Rolf Drechsler; Sebastian Huhn; Christina Plump
Combining Machine Learning and Formal Techniques for Small Data Applications - A Framework to Explore New Structural Materials
In: Euromicro Conference on Digital System Design (DSD). Euromicro Conference on Digital System Design (DSD-2020), August 26-28, Portoro¸, Slovenia, …
Payam Habiby; Sebastian Huhn; Rolf Drechsler
Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power Domain
In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …
Payam Habiby; Sebastian Huhn; Rolf Drechsler
Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power Domains
In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2020. IEEE International Symposium on Defect …

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Robotics Innovation Center

Next Generation Design For Testability, Debug and Reliability Using Formal Techniques

SAT-based Key Determination Attack for Improving the Quality Assessment of Logic Locking Mechanisms

Test Scheduling Optimization Model for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability

A Memory-Upscaled Boolean Satisfiability Solver for Complex On-Chip Self-Verification Tasks

Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques

Optimization-based Test Scheduling for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability

A Codeword-based Compactor for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks

Combining Machine Learning and Formal Techniques for Small Data Applications - A Framework to Explore New Structural Materials

Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power Domain

Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power Domains

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