Publication
A Memory-Upscaled Boolean Satisfiability Solver for Complex On-Chip Self-Verification Tasks
Buse Ustaoglu; Sebastian Huhn; Rolf Drechsler
In: Workshop on Interdependent Challenges of Reliability, Security and Quality (RESCUE). Workshop on Interdependent Challenges of Reliability, Security and Quality (RESCUE-2021), located at Design, Automation and Test in Europe Conference (DATE 2021), February 1-5, Grenoble, France, 2021.