Due to maintenance work, it is currently not possible to search for publications by author.
Payam Habiby; Natalia Lylina; Chih-Hao Wang; Hans-Joachim Wunderlich; Sebastian Huhn; Rolf Drechsler
In: 28th IEEE European Test Symposium 2023. IEEE European Test Symposium (ETS-2023), May 22-26, Venice, Italy, 2023.
Pervaiz Iqbal Khan; Andreas Dengel; Sheraz Ahmed
In: ICAART. International Conference on Agents and Artificial Intelligence (ICAART-2023), February 22-24, Lisbon, Portugal, SCITEPRESS, 2023.
Fatemeh Azimi; Federico Raue; Joern Hees; Andreas Dengel
In: Computer Vision, Imaging and Computer Graphics Theory and Applications: 16th International Joint Conference, VISIGRAPP 2021. International Joint …
Brian Moser; Federico Raue; Stanislav Frolov; Sebastian Palacio; Jörn Hees; Andreas Dengel
In: IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI), Pages 1-21, IEEE, 2/2023.
Yongzhi Su; Yan Di; Fabian Manhardt; Guangyao Zhai; Jason Raphael Rambach; Benjamin Busam; Didier Stricker; Federico Tombari
In: IEEE Robotics and Automation Letters (RA-L), Vol. 8, Pages 1327-1334, IEEE, 3/2023.
Freddy Sikouonmeu; Martin Atzmueller
In: Konferenzband der 43. GIL-Jahrestagung. GIL-Jahrestagung (GIL-2023) Resiliente Agri-Food-Systeme: Herausforderungen und Lösungsansätze. …
Sogo Pierre Sanon; Rekha Reddy; Christoph Lipps; Hans D. Schotten
In: 5TH SECURITY TRUST PRIVACY FOR CYBER-PHYSICAL SYSTEMS (STP-CPS'23). IEEE Consumer Communications and Networking Conference (CCNC-2023), January 8, …
Hamed Tabrizchi; Jafar Razmara; Amirhosein Mosavi
In: Energy Reports, Vol. 9, Pages 2253-2268, Elsevier, 12/2023.
Igor Vozniak; Philipp Müller; Lorena Hell; Nils Lipp; Ahmed Abouelazm; Christian Müller
In: CVF. IEEE Winter Conference on Applications of Computer Vision (WACV-2023), January 4-6, Waikoloa, Hawaii, USA, Pages 950-960, IEEE Explore, IEEE …
Boris Brandherm; Matthieu Deru; Alassane Ndiaye; Gian-Luca Kiefer; Jörg Baus; Ralf Gampfer
In: Thomas Barton; Christian Müller. Apply Data Science: Introduction, Applications and Projects. Pages 137-158, ISBN 978-3-658-38798-3, Springer …
