Project | IBAS-STEM

In this project, we will develop sparse sampling strategies, also called compressed sensing (CS), to increase in the throughput and reduce the required electron dose of three dimensional (3D) Scanning Electron Microscopy (SEM) imaging platforms, particularly in the field of life sciences. Hereby, a solution will be investigated for using prior image knowledge and CS algorithms to reduce the overall samples required for reconstructing high-resolution 3D datasets. This way, electron dose can be spent more effectively compared to a sampling scheme based on a uniform grid.