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In: 34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2022) February 27-March 1 Bremerhaven Germany 2022.
To the publicationIn: 34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2022) February 27-March 1 Bremerhaven Germany 2022.
To the publicationIn: 40th IEEE VLSI Test Symposium (VTS). IEEE VLSI Test Symposium (VTS-2022) April 25-27 San Diego United States 2022.
To the publicationIn: IEEE European Test Symposium (ETS). IEEE European Test Symposium (ETS-27) May 23-27 Barcelona Spain 2022.
To the publicationIn: Dr. M. Hashimoto (editor). Microelectronics Reliability Pages 01-11 Elsevier 2022.
To the publicationIn: 33. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2021). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2021) February 21-23 Nordhausen Germany 2021.
To the publicationIn: Workshop on Interdependent Challenges of Reliability, Security and Quality (RESCUE). Workshop on Interdependent Challenges of Reliability, Security and Quality (RESCUE-2021) located at Design, Automation and Test in Europe Conference (DATE 2021) February 1-5 Grenoble France 2021.
To the publicationISBN 978-3-030-69208-7 Springer 2021.
To the publicationIn: 16th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS-2021) June 28-30 Apulia/Virtual Italy 2021.
To the publicationIn: Proceedings of the 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2021) October 6-8 Athens/Virtual Greece 2021.
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