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Publications

 

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Displaying results 91 to 100 of 507.
  1. Johannes Bayer (Hrsg.)

    IAPR

    IAPR International Workshop on Graphics Recognition (GREC-2017), located at 12th IAPR International Workshop on Graphics Recognition, Japan, 2017.

  2. Faysal Boughorbel; Pavel Potocek; Milos Hovorka; Libor Strakos; John Mitchels; Tomas Vystavel; Patrick Trampert; Ben Lich; Tim Dahmen

    High-Throughput Large Volume SEM Workflow using Sparse Scanning and In-painting Algorithms Inspired by Compressive Sensing

    In: Microscopy and Microanalysis, Vol. 23, No. S1, Pages 150-151, Cambridge University Press, 7/2017.

  3. Andreas Schoknecht; Tom Thaler; Peter Fettke; Andreas Oberweis; Ralf Laue

    Similarity of Business Process Models - A State-of-the-Art Analysis

    In: ACM Computing Surveys (CSUR), Vol. 50, No. 4, Pages 52:1-52:33, ACM New York, New York, NY, USA, 8/2017.

  4. Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill

    Neural Computation of Statistical Image Properties in Peripheral Vision

    In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …

  5. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  6. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …

  7. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …

  8. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …

  9. João Pias; Pedro Miguel Neves; Luís Cortesão; Janis Zemitis; César Analide

    AI: overview and applications

    In: Pedro Carvalho; Ana Patrícia Monteiro; Arnaldo Santos (Hrsg.). InnovAction, Vol. 1, No. 2, Pages 104-122, Altice, 2017.

  10. Hiroki Ohashi; Mohammad Al-Naser; Sheraz Ahmed; Takayuki Akiyama; Takuto Sato; Phong Nguyen; Katsuyuki Nakamura; Andreas Dengel

    Augmenting Wearable Sensor Data with Physical Constraint for DNN-Based Human-Action Recognition

    In: Time Series Workshop. Time Series Workshop @ ICML, located at ICML 2017, August 11, Sydney, Australia, 2017.