Publications

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1. Payam Habiby; Fatemeh Shirinzadeh; Rolf Drechsler

   An Evolutionary Approach to Reconfigurable Scan Network Design

   In: 36. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2024), February 25-27, Darmstadt, Germany, 2024.

2. Payam Habiby; Fatemeh Shirinzadeh; Sebastian Huhn; Rolf Drechsler

   A Multi-Objective Evolutionary Approach for Test Network Design

   In: IEEE 29th European Test Symposium. IEEE European Test Symposium (ETS-2024), May 20-24, Den Haag, Netherlands, 2024.

3. Payam Habiby; Sebastian Huhn; Rolf Drechsler

   Remote Configuration Methodology for IEEE 1687 Scan Networks

   In: 35. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2023), February 26-28, Erfurt, Germany, 2023.

4. Payam Habiby; Natalia Lylina; Chih-Hao Wang; Hans-Joachim Wunderlich; Sebastian Huhn; Rolf Drechsler

   Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips

   In: 28th IEEE European Test Symposium 2023. IEEE European Test Symposium (ETS-2023), May 22-26, Venice, Italy, 2023.

5. Payam Habiby; Sebastian Huhn; Rolf Drechsler

   RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks

   In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2023), October 3-5, Juan-Les-Pins, France, 2023.

6. Payam Habiby; Sebastian Huhn; Rolf Drechsler

   An ILP-based Global Optimum Test Scheduler for IEEE 1687 Multi-Power Domain Networks

   In: 34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2022), February 27 - March 1, Bremerhaven, Germany, 2022.

7. Payam Habiby; Sebastian Huhn; Rolf Drechsler

   Power-aware Test Scheduling Framework for IEEE 1687 Multi-Power Domain Networks using Formal Techniques

   In: Dr. M. Hashimoto (Hrsg.). Microelectronics Reliability, Pages 01-11, Elsevier, 2022.

8. Payam Habiby; Sebastian Huhn; Rolf Drechsler

   Optimization-based Test Scheduling for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability

   In: 16th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS-2021), June 28-30, Apulia/Virtual, Italy, 2021.

9. Payam Habiby; Sebastian Huhn; Rolf Drechsler

   Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power Domains

   In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2020. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2020), ISBN 978-1-7281-9457-8, IEEE, 2020.

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