Polynomial Test Pattern Generation for Fully Testable Circuits derived from KFDDs

@inproceedings{pub16701,
    author = {

Schnieber, Martha
 and 

Drechsler, Rolf
},
    title = {Polynomial Test Pattern Generation for Fully Testable Circuits derived from KFDDs},
    booktitle = {GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ). GI/GMM/ITG Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ-2026), February 22-24, Potsdam, Germany
},
    year = {2026}
}