Publication
Marcel Merten, Sebastian Huhn, Rolf Drechsler
In: 40th IEEE VLSI Test Symposium (VTS). IEEE VLSI Test Symposium (VTS-2022) April 25-27 San Diego United States 2022.
@inproceedings{pub12215, author = { Merten, Marcel and Huhn, Sebastian and Drechsler, Rolf }, title = {A Hardware-based Evolutionary Algorithm with Multi-Objective Optimization Operators for On-Chip Transient Fault Detection}, booktitle = {40th IEEE VLSI Test Symposium (VTS). IEEE VLSI Test Symposium (VTS-2022), April 25-27, San Diego, United States}, year = {2022} }
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