A Codeword-based Compactor for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks

@inproceedings{pub11748,
    author = {

Merten, Marcel
 and 

Huhn, Sebastian
 and 

Drechsler, Rolf
},
    title = {A Codeword-based Compactor for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks},
    booktitle = {Proceedings of the 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2021), October 6-8, Athens/Virtual, Greece},
    year = {2021}
}