Publikation
RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks
Payam Habiby; Sebastian Huhn; Rolf Drechsler
In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2023), October 3-5, Juan-Les-Pins, France, 2023.
Zusammenfassung
Incorporating effective scan infrastructures is becoming increasingly necessary due to the growing complexity of modern system-on-chips, as it provides efficient access to embedded instruments. IEEE 1687 Std. (IJTAG) addresses this fundamental requirement by introducing a reconfigurable access methodology which contributes to reducing the overall access time. This is achieved by integrating programmable elements into the network
to shorten the length of the scan chain. However, the additional time overhead due to the configuration of these components poses a significant challenge to the IJTAG networks. This work tackles the problem by proposing a methodology for designing remotely controlled multi-power domain IJTAG networks based on prior knowledge about the instrument access plan and the power characteristics of the circuit. More precisely, the proposed methodology describes how to synthesize an IJTAG network to avoid unnecessary data shifting through the configuration registers to finally minimize the overall access time. This approach results in designing an instrument scan network that is controlled remotely through another reconfigurable network. The experimental results prove a considerable reduction of the overall access time and area overhead compared to the benchmark networks.