In: IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI), Vol. 44, No. 10, Pages 6795-6806, IEEE, 2022.
Niklas Funk; Charles B. Schaff; Rishabh Madan; Takuma Yoneda; Julen Urain De Jesus; Joe Watson; Ethan K. Gordon; Felix Widmaier; Stefan Bauer; Siddhartha S. Srinivasa; Tapomayukh Bhattacharjee; Matthew R. Walter; Jan Peters