Path Delay Fault Testable KFDD Circuits with Polynomial Test Pattern Generation

@inproceedings{pub16811,
    author = {

Schnieber, Martha
 and 

Drechsler, Rolf
},
    title = {Path Delay Fault Testable KFDD Circuits with Polynomial Test Pattern Generation},
    booktitle = {31st IEEE European Test Symposium. IEEE European Test Symposium (ETS-2026), May 25-29, Chania, Greece
},
    year = {2026},
    publisher = {IEEE}
}