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Publikation

Towards an Automated Debugging Approach for Fault Identification in Quantum Circuits

Anton Maidl; Abhoy Kole; Kamalika Datta; Jannis Ulrich Stoppe; Rolf Drechsler
In: 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2025), May 5-7, Lyon, France, 2025.

Zusammenfassung

In this paper, we propose a novel method for locating and diagnosing bugs in quantum circuits. Debugging in the quantum domain is especially challenging due to the inherent inability of assessing the quantum state of a program. Moreover, explaining the root cause behind unexpected outcomes is hard due to the limited information gain provided by measurements. Our approach aims to address both of these issue: Firstly, the bug site is identified using a standard circuit slicing technique combined with an associated measurement strategy. Secondly, we provide information about the nature of the bug, generated through repeated measurements. To minimize the number of measurements, we introduce a notion of equivalence classes based on unitary operations. This allows us to partition the gate library into classes that produce indistinguishable results under certain measurements. Finally, We assess the effectiveness and measurement complexity of our method by applying it to relevant primitive gate components and well-known quantum algorithms. Our empirical results shows that in 95.79% of all cases, our approach reveals the correct location of the bug along with a valid set of fault candidates. Furthermore, we demonstrate that the required number of circuit executions scales logarithmically with the circuit depth or linearly with the number of qubits.

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