Publikation
Measurement-Driven Adaptive Low-Overhead Implementation of Multi-Controlled Toffoli Gates
Abhoy Kole; Till Schnittka; Rolf Drechsler
In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2026), April 27-29, Bratislava, Slovakia, 2026.
Zusammenfassung
The Toffoli gate is a fundamental building block for
quantum arithmetic and reversible logic, yet its efficient realization remains a major challenge in both near-term and faulttolerant quantum architectures. Recent advances in dynamic
quantum circuit capabilities, including mid-circuit measurement
and classical feedforward, provide new opportunities for reducing
the resource overhead of non-Clifford operations.
In this work, we propose a set of dynamic decomposition
strategies for multi-controlled Toffoli gates that exploit adaptive circuit execution and ancilla-assisted constructions. Our
methods systematically reduce entangling-gate count, T-count,
and T-depth compared with conventional static decompositions,
while preserving fault-tolerance guarantees. Through analytical
cost models and experimental evaluation, we demonstrate that
relative-phase primitives and measurement-conditioned corrections enable scalable implementations with improved depth and
resource efficiency.