Publikation
Foveated Depth-of-Field Filtering in Head-mounted Displays
Martin Weier; Thorsten Roth; Andre Hinkenjann; Philipp Slusallek
In: SAP'18: Proceedings of the 15th ACM Symposium on Applied Perception. ACM Symposium on Applied Perception (SAP-2018), ACM Symposium on Applied Perception, located at Siggraph; APGV Applied Perception in Graphics & Visualization, August 10-11, Vancouver, BC, Canada, ISBN 978-1-4503-5894-1, ACM, 2018.
Zusammenfassung
n.a.