Johannes Ihl; Tobias Jungbluth; Maurice Rekrut; Antonio Krüger
In: Proceedings of the IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering. IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2024), Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, October 21-23, St. Albans, United Kingdom, IEEE, 2024.