Ensuring Correctness of Next Generation Devices: From Reconfigurable to Self-Learning Systems

@inproceedings{pub10722,
    author = {

Drechsler, Rolf
 and 

Große, Daniel
},
    title = {Ensuring Correctness of Next Generation Devices: From Reconfigurable to Self-Learning Systems},
    booktitle = {28th IEEE Asian Test Symposium. Asian Test Symposium (ATS-2019), December 10-13, Kolkata, India},
    year = {2019}
}