Optimizing Run-Time Assertions for Quantum Circuit Debugging: A Depth–Ancilla Tradeoff

@inproceedings{pub17659,
    author = {



Rudkowski, Karl Aaron
 and 



Kole, Abhoy
 and 



Drechsler, Rolf
},
    title = {Optimizing Run-Time Assertions for Quantum Circuit Debugging: A Depth–Ancilla Tradeoff},
    booktitle = {39th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. 

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2026), September 30-October 2, Rom, Italy
},
    year = {2026},
    publisher = {IEEE}
}