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Publikationen

Zeige Ergebnisse 51 bis 60 von 507
  1. Patrick Elfert; Marco Eichelberg; Johannes Tröger; Jochen Britz; Jan Alexandersson; Daniel Bieber; Jürgen Bauer; Susanne Teichmann; Ludwig Kuhn; Martin Thielen; Janina Sauer; Alexander Münzberg; Norbert Rösch; Julia Woizischke; Rebeacca Diekmann; Andreas Hein

    DiDiER - digitized services in dietary counselling for people with increased health risks related to malnutrition and food allergies

    In: 2017 IEEE Symposium on Computers and Communications (ISCC). IEEE Symposium on Computers and Communications (ISCC-2017), 22nd, July 3-6, Heraklion, …

  2. Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill

    Neural Computation of Statistical Image Properties in Peripheral Vision

    In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …

  3. Andreas Schoknecht; Tom Thaler; Peter Fettke; Andreas Oberweis; Ralf Laue

    Similarity of Business Process Models - A State-of-the-Art Analysis

    In: ACM Computing Surveys (CSUR), Vol. 50, No. 4, Pages 52:1-52:33, ACM New York, New York, NY, USA, 8/2017.

  4. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  5. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …

  6. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …

  7. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …

  8. Ayushman Dash; John Cristian Borges Gamboa; Sheraz Ahmed; Marcus Liwicki; Muhammad Zeshan Afzal

    TAC-GAN-text conditioned auxiliary classifier generative adversarial network

    arxiv, 2017.

  9. Octavia-Maria Şulea; Marcos Zampieri; Shervin Malmasi; Mihaela Vela; Liviu P. Dinu; Josef van Genabith

    Exploring the Use of Text Classification in the Legal Domain.

    In: Proceedings of the Second Workshop on Automated Semantic Analysis of Information in Legal Text. Automated Semantic Analysis of Information in …