Towards Reliable LLM-Assisted Verification Artifact Generation in EDA
Khushboo Qayyum; Qurrat Ul Ain; Muhammad Hassan; Asjad Afnan Asjad Afnan; Rolf Drechsler
In: IEEE International Conference on Omni-Layer Intelligent Systems (COINS). IEEE International Conference on Omni-layer Intelligent Systems (IEEE COINS), September 7-9, Bologna, Italy, IEEE, 2026.
