Towards Reliable LLM-Assisted Verification Artifact Generation in EDA

@inproceedings{pub17651,
    author = {



Qayyum, Khushboo
 and 



Ain, Qurrat Ul
 and 



Hassan, Muhammad
 and 



Asjad Afnan, Asjad Afnan
 and 



Drechsler, Rolf
},
    title = {Towards Reliable LLM-Assisted Verification Artifact Generation in EDA},
    booktitle = {IEEE International Conference on Omni-Layer Intelligent Systems (COINS). 

IEEE International Conference on Omni-layer Intelligent Systems (IEEE COINS), September 7-9, Bologna, Italy
},
    year = {2026},
    publisher = {IEEE}
}