Milan Niehaus; Janina Senner; Alexander Fehler; Kevin Pacco; Christian Linn; Jan Budke; Alexander Schalk; Lothar Ahle; Boris Brandherm; Franziska Mohaupt; Peter Eckerle; Swantje Gährs (Hrsg.)
Milan Niehaus; Janina Senner; Alexander Fehler; Kevin Pacco; Christian Linn; Jan Budke; Alexander Schalk; Lothar Ahle; Boris Brandherm; Franziska Mohaupt; Peter Eckerle; Swantje Gährs (Hrsg.)
In: 27th International Conference on Intelligent User Interfaces (IUI '22), March 22--25, 2022, Helsinki, Finland. International Conference on Intelligent User Interfaces (IUI-2022), 27th Annual Conference on Intelligent User Interfaces, March 22-25, Helsinski, Finland, ISBN 978-1-4503-9144-3/22/03, ACM, 3/2022.
Abdul Rafey Aftab; Michael von der Beeck; Steven Rohrhirsch; Benoit Diotte; Michael Feld
In: 25th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2022), April 6-8, Prague, Czech Republic, 2022.
In: 25th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2022), April 6-8, Prague, Czech Republic, 2022.
In: 25th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2022), April 6-8, Prague, Czech Republic, 2022.
In: 25th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2022), April 6-8, Prague, Czech Republic, 2022.