In: 41st IEEE VLSI Test Symposium (VTS). IEEE VLSI Test Symposium (VTS-2023), April 24-26, San Diego, CA, USA, 2023.
Jens Trommer; Niladri Bhattacharjee; Thomas Mikolajick; Sebastian Huhn; Marcel Merten; Mohammed E. Djeridane; Muhammad Hassan; Rolf Drechsler; Shubham Rai; Nima Kavand; Armin Darjani; Akash Kumar; Violetta Sessi; Maximilian Drescher; Sabine Kolodinski; Maciej Wiatr