In: 41st IEEE VLSI Test Symposium (VTS). IEEE VLSI Test Symposium (VTS-2023), April 24-26, San Diego, CA, USA, 2023.
Sebastian Rahn; Philipp Gehricke; Can-Leon Petermöller; Eric Neumann; Philipp Schlinge; Leon Rabius; Henning Termühlen; Christopher Sieh; Marco Tassemeier; Thomas Wiemann; Mario Porrmann
In: Proceedings of th 2023 Workshop on Drone Systems Engineering. Drone Systems Engineering (DroneSE-2023), January 17-18, Tolouse, France, ACM Digital LIbrary, 2023.
In: International Conference on Pattern Recognition Applications and Methods. International Conference on Pattern Recognition Applications and Methods (ICPRAM-2023), February 22-24, Lissabon, Portugal, SCITEPRESS, 2023.
In: Proceedings of the 28th Asia and South Pacific Design Automation Conference (ASP-DAC). Asia and South Pacific Design Automation Conference (ASP-DAC-2023), February 16-19, Tokyo, Japan, 2023.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI), Pages 1-21, IEEE, 2/2023.
Jan Christoph Krause; Jaron Martinez; Henry Gennet; Martin Urban; Jens Herbers; Stefan Menke; Sebastian Röttgermann; Joachim Hertzberg; Arno Ruckelshausen
In: Referate der 43. GIL-Jahrestagung. Jahrestagung der Gesellschaft für Informatik in der Land-, Forst- und Ernährungswirtschaft (GIL-2023), February 13-14, Osnabrück, Germany, Köllen Druck+Verlag GmbH, Bonn, 2/2023.
In: WDSA - CCWI - Proceedings Book. International Joint Conference on Water Distribution Systems Analysis & Computing and Control in the Water Industry (WDSA/CCWI-2022), 2nd, July 18-22, Valencia, Spain, Universitat Politècnica de València, 2023.
In: Thomas Barton; Christian Müller. Apply Data Science: Introduction, Applications and Projects. Pages 137-158, ISBN 978-3-658-38798-3, Springer Fachmedien, Wiesbaden, 2023.