Skip to main content Skip to main navigation

Publikationen

Zeige Ergebnisse 521 bis 530 von 15033.
  1. Fault-Tolerant Character Recognition in Neuromorphic Systems Using RRAM Crossbar Arrays

    In: IEEE Nordic Circuits and Systems Conference (NorCAS). IEEE Nordic Circuits and Systems Conference (NorCAS-2025), October 21-23, Riga, Lithuania, IEEE, 2025.

  2. Performance Evaluation of MAGIC-ReRAM Arithmetic Circuits for Low-Latency In-Memory Computing

    In: IEEE Nordic Circuits and Systems Conference. IEEE Nordic Circuits and Systems Conference (NorCAS-2025), October 28-29, Riga, Lithuania, IEEE, 2025.

  3. Bernhard Berger; Christina Plump

    Automatic Security-Flaw Detection — Towards a Fair Evaluation and Comparison

    In: Software and Systems Modeling (SoSyM), Springer Science and Business Media LLC, 2025.

  4. Efficient Evolution of Variable Ordering for Binary Decision Diagram Optimization

    In: IEEE Transactions on Evolutionary Computation, Pages 1-11, IEEE, 5/2025.

  5. Khushboo Qayyum; Chandan Jha; Sallar Ahmadi-Pour; Muhammad Hassan; Rolf Drechsler

    LLM-assisted Bug Identification and Correction for Verilog HDL

    In: ACM Transactions on Design Automation of Electronic Systems (TODAES), Vol. 30, No. 06, Pages 1-28, ACM, 10/2025.

  6. Mohamed Nadeem; Luca Müller; Chandan Jha; Rolf Drechsler

    Advanced And-Inverter Graph Decomposition Technique for Reducing Circuit Complexity

    In: ACM Transactions on Design Automation of Electronic Systems (TODAES), ACM, 2025.

  7. Adrian Lutsch; Muhammad El-Hindi; Zsolt István; Carsten Binnig

    Towards High-performance and Trusted Cloud DBMSs

    In: Datenbank-Spektrum (Spektrum), Vol. 25, No. 1, Pages 39-50, Springer, 2025.

  8. Chandan Jha; Sumit Kumar Jha; Ulf Schlichtmann; Rolf Drechsler

    Formal Verification Techniques and Reliability Methods for RRAM-based Computing-in-Memory

    In: 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), October 21-23, Barcelona, Spain, IEEE, 2025.

  9. Alon Lavie; Greg Hanneman; Sweta Agrawal; Diptesh Kanojia; Chi-Kiu Lo; Vilém Zouhar; Frederic Blain; Chrysoula Zerva; Eleftherios Avramidis; Sourabh Deoghare; Archchana Sindhujan; Jiayi Wang; David Ifeoluwa Adelani; Brian Thompson; Tom Kocmi; Markus Freitag; Daniel Deutsch

    Findings of the WMT25 Shared Task on Automated Translation Evaluation Systems: Linguistic Diversity is Challenging and References Still Help

    In: Barry Haddow; Tom Kocmi; Philipp Koehn; Christof Monz (Hrsg.). Proceedings of the Tenth Conference on Machine Translation. Conference on Machine Translation (WMT-25), located at EMNLP2025, November 8-9, Suzhou, China, Pages 436-483, ISBN 979-8-89176-341-8, Association for Computational Linguistics, 11/2025.