In: 2025 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE). IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2025), October 22-24, Ancona, Italy, Pages 7-12, IEEE, 11/2025.
Duy M. H. Nguyen; Tuan A. Tran; Duong Nguyen; Siwei Xie; Trung Nguyen; Mai T. N. Truong; Daniel Palenicek; An T. Le; Michael Barz; TrungTin Nguyen; Tuan Quang Dam; Hong Anh Le; Minh Vu; Khoa D. Doan; Ngo Anh Vien; Pengtao Xie; James Zou; Daniel Sonntag; Jan Peters; Mathias Niepert