In: Informatik Spektrum, Pages 1-9, Springer Berlin Heidelberg, 9/2024.
Annette Spellerberg; Klaus J. Beckmann; Emilia Bruck; Dirk Engelke; Martina Hülz; Stefan Höffken; Florian Koch; Jens Libbe; Martin Memmel; Frank Othengrafen; Eva Maria Reinecke; Eva Schweitzer
In: Proceedings of the 14th International Conference on Pattern Recognition Applications and Methods. International Conference on Pattern Recognition Applications and Methods (ICPRAM-2025), February 23-25, Porto, Portugal, SCITEPRESS (Science and Technology Publications, Lda), 2025.
In: Proceedings of the 2024 ACM Symposium on Spatial User Interaction (SUI '24). ACM Symposium on Spatial User Interaction (SUI-2024), October 7-8, Trier, Germany, Pages 1-2, No. 40, ISBN 9798400710889, Association for Computing Machinery, New York, NY, USA, 10/2024.
Wolfgang Maaß; Ankit Agrawal; Alessandro Ciani; Sven Danz; Alejandro Delgadillo; Philipp Ganser; Pascal Kienast; Marco Kulig; Valentina König; Nil Rodellas-Gràcia; Rivan Rughubar; Stefan Schröder; Marc Stautner; Hannah Stein; Tobias Stollenwerk; Daniel Zeuch; Frank K. Wilhelm
In: KI - Künstliche Intelligenz, German Journal on Artificial Intelligence - Organ des Fachbereiches "Künstliche Intelligenz" der Gesellschaft für Informatik e.V. (KI), Vol. 38, Pages 1-10, Springer, 10/2024.
In: Proceedings of the IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering. IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2024), Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, October 21-23, St. Albans, United Kingdom, IEEE, 2024.
In: Proceedings of the IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering. IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2024), Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, October 21-23, St. Albans, United Kingdom, IEEE, 2024.