In: 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), October 21-23, Barcelona, Spain, IEEE, 2025.
Tom Kocmi; Sweta Agrawal; Ekaterina Artemova; Eleftherios Avramidis; Eleftheria Briakou; Pinzhen Chen; Marzieh Fadaee; Markus Freitag; Roman Grundkiewicz; Yupeng Hou; Philipp Koehn; Julia Kreutzer; Saab Mansour; Stefano Perrella; Lorenzo Proietti; Parker Riley; Eduardo Sánchez; Patricia Schmidtova; Mariya Shmatova; Vilém Zouhar
In: Barry Haddow; Tom Kocmi; Philipp Koehn; Christof Monz (Hrsg.). Proceedings of the Tenth Conference on Machine Translation. Conference on Machine Translation (WMT-25), November 8-9, Suzhou, China, Pages 414-435, ISBN 979-8-89176-341-8, Association for Computational Linguistics, 11/2025.
Tom Kocmi; Ekaterina Artemova; Eleftherios Avramidis; Rachel Bawden; Ondrej Bojar; Konstantin Dranch; Anton Dvorkovich; Sergey Dukanov; Mark Fishel; Markus Freitag; Thamme Gowda; Roman Grundkiewicz; Barry Haddow; Marzena Karpinska; Philipp Koehn; Howard Lakougna; Jessica Lundin; Christof Monz; Kenton Murray; Masaaki Nagata; Stefano Perrella; Lorenzo Proietti; Martin Popel; Maja Popovic; Parker Riley; Mariya Shmatova; Steinthór Steingrímsson; Lisa Yankovskaya; Vilém Zouhar
In: Barry Haddow; Tom Kocmi; Philipp Koehn; Christof Monz (Hrsg.). Proceedings of the Tenth Conference on Machine Translation. Conference on Machine Translation (WMT-25), November 8-9, Suzhou, China, Pages 355-413, ISBN 979-8-89176-341-8, Association for Computational Linguistics, 11/2025.
In: Christos Christodoulopoulos; Tanmoy Chakraborty; Carolyn Rose; Violet Peng (Hrsg.). Proceedings of the 2025 Conference on Empirical Methods in Natural Language Processing. Conference on Empirical Methods in Natural Language Processing (EMNLP-2025), November 4-10, Suzhou, China, Pages 8293-8314, ISBN 979-8-89176-332-6, Association for Computational Linguistics, 11/2025.
In: University Fair Workshop on Design, Automation and Test in Europe Conference (DATE). Design, Automation & Test in Europe (DATE-2025), Lyon, France, 2025.
In: 7th International Conference on Emerging Electronics (ICEE 2025). IEEE International Conference on Engineering and Emerging Technologies (ICEET), December 13-16, Bengaluru, India, 2025.