In: 2025 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE). IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2025), October 22-24, Ancona, Italy, Pages 7-12, IEEE, 11/2025.
Verena Wolf; Christel Baier; Mila Majster-Cederbaum
In: Ahmed Bouajjani; Oded Maler. International Conference on Computer Aided Verification. Pages 337-352, ISBN 9783642026584, Springer Berlin Heidelberg, Heidelberg, 6/2009.