In: 2025 IEEE International Conference on Advanced Learning Technologies (ICALT). IEEE International Conference on Advanced Learning Technologies (ICALT-2025), July 14-17, Pages 384-388, IEEE, 7/2025.
In: International Conference on Document Analysis and Recognition. International Conference on Document Analysis and Recognition (ICDAR-2025), The 19th International Conference on Document Analysis and Recognition, located at ICDAR-2025, September 16-21, Hubei, Wuhan, China, Springer Nature, 2025.
In: International Conference on Document Analysis and Recognition. International Conference on Document Analysis and Recognition (ICDAR-2024), The 18th International Conference on Document Analysis and Recognition, located at ICDAR-2024, August 30 - September 4, Athens, Greece, Springer, 2024.
In: International Conference on Federated Learning Technologies and Applications (FLTA). International Conference on Federated Learning Technologies and Applications (FLTA-2025), located at FLTA25, October 14-17, Dubrovnik, Croatia, Pages 40-47, DFKI Research Reports (RR), ISBN 979-8-3315-5670-9, IEEE, 1/2026.
Qiwei Peng; Robert Moro; Michal Gregor; Ivan Srba; Simon Ostermann; Marian Simko; Juraj Podrouzek; Matúvs Mesarvcík; Jaroslav Kopvcan; Anders Søgaard
In: Sara Rosenthal; Aiala Rosá; Debanjan Ghosh; Marcos Zampieri (Hrsg.). Proceedings of the 19th International Workshop on Semantic Evaluation (SemEval-2025). International Workshop on Semantic Evaluation (SemEval), Vienna, Austria, Pages 2498-2511, ISBN 979-8-89176-273-2, Association for Computational Linguistics, 2025.
In: The IEEE / CVF Computer Vision and Pattern Recognition Conference (CVPR). International Conference on Computer Vision and Pattern Recognition (CVPR-2026), June 3-7, Denver, Colorado, USA, IEEE, 2026.
In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). International Conference on Computer Vision and Pattern Recognition (CVPR-2026), June 3-7, Denver, Colorado, USA, IEEE, 2026.
Sofija Engelson; Yannic Elser; Malte Maria Sieren; Jan Ehrhardt; Julia Andresen; Stefanie Schierholz; Tobias Keck; Daniel Drömann; Jörg Barkhausen; Heinz Handels
In: Medical Imaging 2026: Computer-Aided Diagnosis. SPIE Medical Imaging (SPIE-2026), February 15-19, Vancouver, British Columbia, Canada, SPIE, 2/2026.