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In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2020. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2020), ISBN 978-1-7281-9457-8, IEEE, 2020.
Thomas Stauner; Frédérik Blank; David Michael Fürst; Johannes Günther; Korbinian Hagn; Philipp Heidenreich; Markus Huber; Bastian Knerr; Thomas Schulik; Karl-Ferdinand Leiß
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In: 2023 17th International Conference on Signal-Image Technology & Internet-Based Systems. International Conference on Signal-Image Technology & Internet-Based Systems (SITIS-2023), November 8-10, Bangkok, Thailand, IEEE, 2023.
Marco Bellagente; Manuel Brack; Hannah Benita Teufel; Felix Friedrich; Björn Deiseroth; Constantin Eichenberg; Andrew Dai; Robert John Nicholas Baldock; Souradeep Nanda; Koen Oostermeijer; Andres Felipe Cruz-Salinas; Patrick Schramowski; Kristian Kersting; Samuel Weinbach