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In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2020. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2020), ISBN 978-1-7281-9457-8, IEEE, 2020.
Thomas Stauner; Frédérik Blank; David Michael Fürst; Johannes Günther; Korbinian Hagn; Philipp Heidenreich; Markus Huber; Bastian Knerr; Thomas Schulik; Karl-Ferdinand Leiß
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In: Adjunct Proceedings of the 2021 ACM International Joint Conference on Pervasive and Ubiquitous Computing and Proceedings of the 2021 ACM International Symposium on Wearable Computers. International Joint Conference on Pervasive and Ubiquitous Computing (UbiComp-2021), Proceedings of the 2021 ACM International Symposium on Wearable Computers, Association for Computing Machinery, New York, United States, 2021.
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