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Publikationen

Zeige Ergebnisse 21 bis 30 von 15161.
  1. What Are We Measuring in NLG? A Meta-Analysis of Evaluation Trends 2020-2025

    In: Proceedings of the 2026 Conference on Empirical Methods in Natural Language Processing (EMNLP 2026). Conference on Empirical Methods in Natural Language Processing (EMNLP-2026), ACL, 10/2026.

  2. Hans-Georg Fill; Jennifer Horkoff; Peter Fettke; Julius Köppke

    Generative AI and Conceptual Modeling

    In: Oliver Hinz (Hrsg.). Business & Information Systems Engineering (BISE), Vol. 68, Pages 1-5, Springer Nature LINK, Wiesbaden, 2/2026.

  3. Measurement-Driven Adaptive Low-Overhead Implementation of Multi-Controlled Toffoli Gates

    In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2026), April 27-29, Bratislava, Slovakia, 2026.

  4. Approximated MAGIC-ReRAM Adder Circuits for Low-Latency In-Memory Computing

    In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2026), April 27-29, Bratislava, Slovakia, 2026.

  5. Fan-In Aware Graph-Based Optimization for MAC-Based In-Memory Computing

    In: Fatemeh Shirinzadeh, Abhoy Kole, Kamalika Datta, Saeideh Shirinzadeh, Rolf Drechsler. IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2026), April 27-29, Bratislava, Slovakia, 2026.

  6. Spandan Das; Sayak Deb; Khushboo Qayyum; Sallar Ahmadi-Pour; Christoph Lüth; Rolf Drechsler

    Security-Aware Benchmarks for Performance Exploration of CHERI-Enabled Architectures

    In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS-2026), April 27-29, Bratislava, Slovakia, 2026.

  7. Recent advances in tracking control of hydrobatic AUVs

    In: at - Automatisierungstechnik, Vol. 74, No. 2, Pages 91-101, De Gruyter, 3/2026.

  8. Automation of Polynomial Formal Verification using Large Language Models

    In: 44th IEEE VLSI Test Symposium (VTS). IEEE VLSI Test Symposium (VTS-2026), April 27-29, Napa, USA, 2026.