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Publications

Displaying results 1541 to 1550 of 14838.

  1. Daniel Geißler; Bo Zhou; Paul Lukowicz

    Strategies and Challenges of Efficient White-Box Training for Human Activity Recognition

    In: IEEE PerCom 2025 Proceedings (Hrsg.). IEEE PerCom. International Conference on Supercomputing (ICS), IEEE, 2025.

  2. Shalini Sarode; Muhammad Saif Ullah Khan; Tahira Shehzadi; Didier Stricker; Muhammad Zeshan Afzal

    Classroom-Inspired Multi-Mentor Distillation with Adaptive Learning Strategies

    In: Intelligent Systems and Applications. Intelligent Systems Conference (IntelliSys-2025), 11th Intelligent Systems Conference 2025, Amsterdam, Netherlands, Springer Nature Switzerland, 8/2025.

  3. Khushboo Qayyum; Chandan Jha; Sallar Ahmadi-Pour; Muhammad Hassan; Rolf Drechsler

    LLM-assisted Bug Identification and Correction for Verilog HDL

    In: ACM Transactions on Design Automation of Electronic Systems (TODAES), Vol. 30, No. 06, Pages 1-28, ACM, 10/2025.

  4. Mohamed Nadeem; Luca Müller; Chandan Jha; Rolf Drechsler

    Advanced And-Inverter Graph Decomposition Technique for Reducing Circuit Complexity

    In: ACM Transactions on Design Automation of Electronic Systems (TODAES), ACM, 2025.

  5. Moritz Schmidt; Abhoy Kole; Leon Wichette; Rolf Drechsler; Frank Kirchner; Elie Mounzer

    Exploration of Design Alternatives for Reducing Idle Time in Shor’s Algorithm: A Study on Monolithic and Distributed Quantum Systems

    In: IEEE Transactions on Quantum Engineering, Vol. 6, IEEE, 9/2025.

  6. Adrian Lutsch; Muhammad El-Hindi; Zsolt István; Carsten Binnig

    Towards High-performance and Trusted Cloud DBMSs

    In: Datenbank-Spektrum (Spektrum), Vol. 25, No. 1, Pages 39-50, Springer, 2025.

  7. Chandan Jha; Sumit Kumar Jha; Ulf Schlichtmann; Rolf Drechsler

    Formal Verification Techniques and Reliability Methods for RRAM-based Computing-in-Memory

    In: 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), October 21-23, Barcelona, Spain, IEEE, 2025.

  8. Chandan Jha; Sallar Ahmadi-Pour; Sajjad Parvin; Rolf Drechsler

    DIVIAC: Library of Input Data Aware Approximate Dividers with Partial Exact Minimization

    In: 39th International Conference On VLSI Design. International Conference on VLSI Design (VLSID-2026), January 3-7, Pune, India, 2026.

  9. Fatma Ozcan; Yeounoh Chung; Yannis Chronis; Lyubomir Ganev; Yawen Wang; Carsten Binnig; Johannes Wehrstein; Gaurav Tarlok Kakkar; Sami Abu-el-haija

    LLMs and Databases: A Synergistic Approach to Data Utilization

    In: IEEE Data Engineering Bulletin, Vol. 49, No. 1, Pages 32-44, IEEE, 2025.

  10. Daniel Palenicek; Michael Lutter; Jo~ao Carvalho; Daniel Dennert; Faran Ahmad; Jan Peters

    Diminishing Return of Value Expansion Methods

    In: Computing Research Repository eprint Journal (CoRR), Vol. abs/2412.20537, Pages 1-21, arXiv, 2024.

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