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Publications

Displaying results 1801 to 1810 of 15207.

  1. Patrick Trampert; Delei Chen; Sviatoslav Bogachev; Tim Dahmen; Philipp Slusallek

    Dictionary-based Filling of the Missing Wedge in Electron Tomography

    In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Pages 554-555, Vol. 22, No. Suppl 3, Cambridge University Press, 7/2016.

  2. Patrick Trampert; Sviatoslav Bogachev; Nico Marniok; Tim Dahmen; Philipp Slusallek

    A Comparative Study of Three Marker Detection Algorithms in Electron Tomography

    In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Pages 1044-1045, Vol. 22, No. Suppl 3, Cambridge University Press, 2016.

  3. Tim Dahmen; Philipp Slusallek; Patrick Trampert; Frank Mücklich; Michael Engstler; Christoph Pauly; Niels de Jonge

    Smart Microscopy: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

    In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Page 632, Vol. 22, No. Suppl 3, Cambridge University Press, 2016.

  4. Claudia Peersman; Christian Schulze; Awais Rashid; Margaret Brennan; Carl Fischer

    iCOP: Live forensics to reveal previously unknown criminal media on P2P networks

    In: Eoghan Casey (Hrsg.). Digital Investigation, Vol. 18, Pages 1-2, Elsevier Science Publishers B. V. Amsterdam, 8/2016.

  5. Stephan Eggersglüß; Stefan Holst; Daniel Tille; Kohei Miyase; Xiaoqing Wen

    Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test

    In: The 25th Asian Test Symposium. Asian Test Symposium (ATS-25), November 21-24, Hiroshima, Japan, 2016.

  6. Daniel Große; Hoang M. Le; Muhammad Hassan; Rolf Drechsler

    Guided Lightweight Software Test Qualification for IP Integration using Virtual Prototypes

    In: The 34th IEEE International Conference on Computer Design. IEEE International Conference on Computer Design (ICCD-34), October 3-5, Phoenix, USA, 2016.

  7. Patrick Lübbecke; Peter Fettke; Peter Loos

    Sustainability Patterns for the Improvement of IT-related Business Processes with Regard to Ecological Goals

    In: Marlon Dumas; Marcelo Fantinato (Hrsg.). Business Process Management Workshops. Business Process Management (BPM-2016), International Workshop on Sustainability-Aware Business Process Management, located at BPM 2016, September 18-22, Rio de Janeiro, Brazil, Lecture Notes in Business Information Processing (LNBIP), Vol. 281, Springer, 2017.

  8. Ying Gu; Ansgar Bernardi; Thilo Steckel; Alexander Maier

    Anomaly Detection in Sensor Data provided by Combine Harvesters

    In: INDIN-2016 - 14th International Conference on Industrial Informatics. IEEE International Conference on Industrial Informatics, Special Session #30 - Big Data, Advanced Analytics, and Knowledge Management in Manufacturing Ecosystems, located at INDIN-2016 - 14th International Conference on Industrial Informatics, July 19-21, Poitiers, France, IEEE, 2016.

  9. Seyyed Saleh Mozaffari Chanijani; Mohammad Al-Naser; Syed Saqib Bukhari; Damian Borth; Shanley E. M. Allen; Andreas Dengel

    An Eye Movement Study on Scientific Papers Using Wearable Eye Tracking Technology

    In: The Ninth International Conference on Mobile Computing and Ubiquitous Networking. The International Conference on Mobile Computing and Ubiquitous Networking (ICMU-16), October 4-6, Kaiserslautern, Germany, IEEE, 2016.

  10. Seyyed Saleh Mozaffari Chanijani; Pascal Klein; Syed Saqib Bukhari; Jochen Kuhn; Andreas Dengel

    Entropy Based Transition Analysis of Eye Movement on Physics Representational Competence

    In: Workshop on Ubiquitous Technologies for Augmenting the Human Mind. International Conference on Ubiquitous Computing (Ubicomp-16), September 12-16, Heidelberg, Germany, ACM, 2016.

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