In: 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), October 21-23, Barcelona, Spain, IEEE, 2025.
Fatma Ozcan; Yeounoh Chung; Yannis Chronis; Lyubomir Ganev; Yawen Wang; Carsten Binnig; Johannes Wehrstein; Gaurav Tarlok Kakkar; Sami Abu-el-haija
In: Digitales Management for a Fast-Changing World. International Scientific-Practical Conference (ISPC-2025), 5th annual International Scientific-Practical Conference, September 25-26, Garden City, NY, USA, Springer Proceedings in Business and Economics (SPBE), Springer Nature Link, 9/2025.
Martin Wittmaier; Sebastian Wolff; Marco Wöltje; Ole van Laaten; Thomas Vögele; Babu Ajish; Yuhan Jin; Yi-Ling Liu; Tim Tiedemann; Matthis Trost; Philipp Meyer; Timo Lange; Peter Schaeidt; Joschua Marquart
In: The Thirty-Ninth Annual Conference on Neural Information Processing Systems (NeurIPS). Neural Information Processing Systems (NeurIPS-2025), December 2-12, USA, Advances in Neural Information Processing Systems, 2025.
In: The Thirty-Ninth Annual Conference on Neural Information Processing Systems (NeurIPS). Neural Information Processing Systems (NeurIPS-2025), December 2-12, USA, Advances in Neural Information Processing Systems, 12/2025.
In: Proceedings of the 1st International Conference on Artificial Intelligence for Computing, Astronomy, and Renewable Energy (AICARE). International Conference on Artificial Intelligence for Computing, Astronomy, and Renewable Energy (AICARE-2025), November 21-22, Kolkata, India, IEEE Xplore, 2025.